Debug operations on artificial intelligence operations

ABSTRACT

The present disclosure includes apparatuses and methods related to performing a debug operation on an artificial intelligence operation. An example apparatus can include a number of memory arrays and a controller, wherein the controller is configured to perform an artificial intelligence (AI) operation on data stored in the number of memory arrays and perform a debug operation on the AI operation.

TECHNICAL FIELD

This application is a Continuation of U.S. application Ser. No.16/553,897, filed Aug. 28, 2019, the contents of which are includedherein by reference.

TECHNICAL FIELD

The present disclosure relates generally to memory devices, and moreparticularly, to apparatuses and methods for debug operations onartificial intelligence operations.

BACKGROUND

Memory devices are typically provided as internal, semiconductor,integrated circuits in computers or other electronic devices. There aremany different types of memory including volatile and non-volatilememory. Volatile memory can require power to maintain its data andincludes random-access memory (RAM), dynamic random access memory(DRAM), and synchronous dynamic random access memory (SDRAM), amongothers. Non-volatile memory can provide persistent data by retainingstored data when not powered and can include NAND flash memory, NORflash memory, read only memory (ROM), Electrically Erasable ProgrammableROM (EEPROM), Erasable Programmable ROM (EPROM), and resistance variablememory such as phase change random access memory (PCRAM), resistiverandom access memory (RRAM), and magnetoresistive random access memory(MRAM), among others.

Memory is also utilized as volatile and non-volatile data storage for awide range of electronic applications. Non-volatile memory may be usedin, for example, personal computers, portable memory sticks, digitalcameras, cellular telephones, portable music players such as MP3players, movie players, and other electronic devices. Memory cells canbe arranged into arrays, with the arrays being used in memory devices.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of an apparatus in the form of a computingsystem including a memory device with an artificial intelligence (AI)accelerator in accordance with a number of embodiments of the presentdisclosure.

FIG. 2 is a block diagram of a number of registers on a memory devicewith an artificial intelligence (AI) accelerator in accordance with anumber of embodiments of the present disclosure.

FIGS. 3A and 3B are block diagrams of a number of bits in a number ofregisters on a memory device with an artificial intelligence (AI)accelerator in accordance with a number of embodiments of the presentdisclosure.

FIG. 4 is a block diagram of a number of blocks of a memory device withan artificial intelligence (AI) accelerator in accordance with a numberof embodiments of the present disclosure

FIG. 5 is a flow diagram illustrating an example artificial intelligenceprocess in a memory device with an artificial intelligence (AI)accelerator in accordance with a number of embodiments of the presentdisclosure.

FIG. 6A is a block diagram of an apparatus in the form of a computingsystem including a memory device with an artificial intelligence (AI)accelerator in accordance with a number of embodiments of the presentdisclosure.

FIG. 6B is block diagram of an apparatus in the form of a computingsystem including a memory device having a shared input/out (IO) line ina data path local to bank sections of an array with an artificialintelligence (AI) accelerator in accordance with a number of embodimentsof the present disclosure.

FIG. 7 is a schematic diagram illustrating sensing circuitry of a memorydevice, the sensing circuitry including a compute component, inaccordance with a number of embodiments of the present disclosure.

FIG. 8 is a schematic diagram illustrating circuitry for a plurality ofshared I/O lines in a data path of an array in accordance with a numberof embodiments of the present disclosure.

FIG. 9A is a block diagram example illustrating a plurality of sectionsof an array coupled to a compute unit, having a plurality of logicstripes, by a plurality of shared IO lines in a data path local to thearray.

FIG. 9B is a block diagram example illustrating a plurality of arrayscoupled to a plurality of compute components in a compute unit by aplurality of shared I/O lines in a data path local to the arrays wherethe compute component has a pitch equal to that of the data path of ashared IO line and which is a multiple of a pitch of the digit lines tothe array.

DETAILED DESCRIPTION

The present disclosure includes apparatuses and methods related toperforming debug operations on artificial intelligence operations. Anexample apparatus can include a number of memory arrays and a controllerconfigured to perform an artificial intelligence (AI) operation on datastored in the number of memory arrays and perform a debug operation onthe AI operation. The debug operation can include stopping the AIoperation and storing errors of the AI operation and results of thedebug operation in temporary memory blocks of the number of memoryarrays.

In some examples, a register of the controller can be used to performthe debug operations. To start the debug operation, a first bit of theregister can be programmed to a first state and to stop and/or preventthe debug operation, the first bit of the register can be programmed toa second state. The controller can program the bits and/or bits of theregister to particular states in response to receiving a command fromthe host, for example. A different register of the controller can definethe layer where the debug operations will stop the AI operation, changethe content of the neural network, change the bias values, change theactivation functions, observe the output of the layer, send the outputof the layer, and/or send data.

Performing a debug operation on an artificial intelligence operation bystopping the AI operation and storing errors of the AI operation andresults of the debug operation can improve reliability of the memorydevice. For example, the memory device can detect and correct errors andupdate input data, bias values, activation functions, and/or the neuralnetwork based on the detected and corrected errors to prevent futureerrors.

In the following detailed description of the present disclosure,reference is made to the accompanying drawings that form a part hereof,and in which is shown by way of illustration how a number of embodimentsof the disclosure may be practiced. These embodiments are described insufficient detail to enable those of ordinary skill in the art topractice the embodiments of this disclosure, and it is to be understoodthat other embodiments may be utilized and that process, electrical,and/or structural changes may be made without departing from the scopeof the present disclosure. As used herein, the designator “N” indicatesthat a number of the particular feature so designated can be includedwith a number of embodiments of the present disclosure.

As used herein, “a number of” something can refer to one or more of suchthings. For example, a number of memory devices can refer to one or moreof memory devices. Additionally, designators such as “N”, as usedherein, particularly with respect to reference numerals in the drawings,indicates that a number of the particular feature so designated can beincluded with a number of embodiments of the present disclosure.

The figures herein follow a numbering convention in which the firstdigit or digits correspond to the drawing figure number and theremaining digits identify an element or component in the drawing.Similar elements or components between different figures may beidentified by the use of similar digits. As will be appreciated,elements shown in the various embodiments herein can be added,exchanged, and/or eliminated so as to provide a number of additionalembodiments of the present disclosure. In addition, the proportion andthe relative scale of the elements provided in the figures are intendedto illustrate various embodiments of the present disclosure and are notto be used in a limiting sense.

FIG. 1 is a block diagram of an apparatus in the form of a computingsystem 100 including a memory device 120 in accordance with a number ofembodiments of the present disclosure. As used herein, a memory device120, memory arrays 125-1, . . . 125-N, memory controller 122, and/or AIaccelerator 124 might also be separately considered an “apparatus.”

As illustrated in FIG. 1 , host 102 can be coupled to the memory device120. Host 102 can be a laptop computer, personal computers, digitalcamera, digital recording and playback device, mobile telephone, PDA,memory card reader, interface hub, among other host systems, and caninclude a memory access device, e.g., a processor. One of ordinary skillin the art will appreciate that “a processor” can intend one or moreprocessors, such as a parallel processing system, a number ofcoprocessors, etc.

Host 102 includes a host controller 108 to communicate with memorydevice 120. The host controller 108 can send commands to the memorydevice 120. The host controller 108 can communicate with the memorydevice 120, memory controller 122 on memory device 120, and/or the AIaccelerator 124 on memory device 120 to perform AI operations, readdata, write data, and/or erase data, among other operations. AIaccelerator 124 can also include components described in associated withFIGS. 6A-9B that are configured to perform AI operations. AI operationsmay include machine learning or neural network operations, which mayinclude training operations or inference operations, or both. In someexample, each memory device 120 may represent a layer within a neuralnetwork or deep neural network (e.g., a network having three or morehidden layers). Or each memory device 120 may be or include nodes of aneural network, and a layer of the neural network may be composed ofmultiple memory devices or portions of several memory devices 120.Memory devices 120 may store weights (or models) for AI operations inmemory arrays 125.

A physical host interface can provide an interface for passing control,address, data, and other signals between memory device 120 and host 102having compatible receptors for the physical host interface. The signalscan be communicated between host 102 and memory device 120 on a numberof buses, such as a data bus and/or an address bus, for example.

Memory device 120 can include controller 120, AI accelerator 124, andmemory arrays 125-1, . . . , 125-N. Memory device 120 can be a low-powerdouble data rate dynamic random access memory, such as a LPDDR5 device,and/or a graphics double data rate dynamic random access memory, such asa GDDR6, GDDR7, LPDDR6, DDR4, among other types of devices. Memoryarrays 125-1, . . . , 125-N can include a number of memory cells, suchas volatile memory cells (e.g., DRAM memory cells, among other types ofvolatile memory cells) and/or non-volatile memory cells (e.g., RRAMmemory cells, among other types of non-volatile memory cells). Memorydevice 120 can read and/or write data to memory arrays 125-1, . . . ,125-N. Memory arrays 125-1, . . . , 125-N can store data that is usedduring AI operations performed on memory device 120. Memory arrays125-1, . . . , 125-N can store inputs, outputs, weight matrix and biasinformation of a neural network, and/or activation functions informationused by the AI accelerator to perform AI operations on memory device120.

The host controller 108, memory controller 122, and/or AI accelerator124 on memory device 120 can include control circuitry, e.g., hardware,firmware, and/or software. In one or more embodiments, the hostcontroller 108, controller memory 122, and/or AI accelerator 124 can bean application specific integrated circuit (ASIC) coupled to a printedcircuit board including a physical interface. Registers 130 can belocated on memory controller 122, AI accelerator 124, and/or in memoryarrays 125-1, . . . , 125-N and be accessible by controller 122. Also,memory controller 122 on memory device 120 can include registers 130.Registers 130 can be programmed to provide information for the AIaccelerator to perform AI operations. Registers 130 can include anynumber of registers. Registers 130 can be written to and/or read by host102, memory controller 122, and/or AI accelerator 124. Registers 130 canprovide input, output bias, neural network, and/or activation functionsinformation for AI accelerator 124. Registers 130 can include moderegister 131 to select a mode of operation for memory device 120. The AImode of operation can be selected by writing a word to register 131,such as 0xAA and/or 0x2AA, for example, which inhibits access to theregisters associated with normal operation of memory device 120 andallows access to the registers associated with AI operations. Also, theAI mode of operation can be selected using a signature that uses acrypto algorithm that is authenticated by a key stored in the memorydevice 120.

AI accelerator 124 can include hardware 126 and/or software/firmware 128to perform AI operations. Also, AI accelerator 124 can also includecomponents described in associated with FIGS. 6A-9B that are configuredto perform AI operations. Hardware 126 can include adder/multiplier 126to perform logic operations associated with AI operations. Memorycontroller 122 and/or AI accelerator 124 can received commands from host102 to perform AI operations. Memory device 120 can perform the AIoperations requested in the commands from host 102 using the AIaccelerator 124, data in memory arrays 125-1, . . . , 125-N, andinformation in registers 130. The memory device can report backinformation, such as results and/or error information, for example, ofthe AI operations to host 120. The AI operations performed by AIaccelerator 124 can be performed without use of an external processingresource.

The memory arrays 125-1, . . . , 125-N can provide main memory for thememory system or could be used as additional memory or storagethroughout the memory system. Each memory array 125-1, . . . , 125-N caninclude a number of blocks of memory cells. The blocks of memory cellscan be used to store data that is used during AI operations performed bymemory device 120. Memory arrays 125-1, . . . , 125-N can include DRAMmemory cells, for example. Embodiments are not limited to a particulartype of memory device. For instance, the memory device can include RAM,ROM, DRAM, SDRAM, PCRAM, RRAM, 3D XPoint, and flash memory, amongothers.

By way of example, memory device 120 may perform an AI operation that isor includes one or more inference steps. Memory arrays 125 may be layersof a neural network or may each be individual nodes and memory device120 may be layer; or memory device 120 may be a node within a largernetwork. Additionally or alternatively, memory arrays 125 may store dataor weights, or both, to be used (e.g., summed) within a node. Each node(e.g., memory array 125) may combine an input from data read from cellsof the same or a different memory array 125 with weights read from cellsof memory array 125. Combinations of weights and data may, for instance,be summed within the periphery of a memory array 125 or within hardware126 using adder/multiplier 127. In such cases, the summed result may bepassed to an activation function represented or instantiated in theperiphery of a memory array 125 or within hardware 126. The result maybe passed to another memory device 120 or may be used within AIaccelerator 124 (e.g., by software/firmware 128) to make a decision orto train a network that includes memory device 120.

A network that employs memory device 120 may be capable of or used forsupervised or unsupervised learning. This may be combined with otherlearning or training regimes. In some cases, a trained network or modelis imported or used with memory device 120, and memory device's 120operations are primarily or exclusively related to inference.

The embodiment of FIG. 1 can include additional circuitry that is notillustrated so as not to obscure embodiments of the present disclosure.For example, memory device 120 can include address circuitry to latchaddress signals provided over I/O connections through I/O circuitry.Address signals can be received and decoded by a row decoder and acolumn decoder to access the memory arrays 125-1, . . . , 125-N. It willbe appreciated by those skilled in the art that the number of addressinput connections can depend on the density and architecture of thememory arrays 125-1, . . . , 125-N.

FIG. 2 is a block diagram of a number of registers on a memory devicewith an artificial intelligence (AI) accelerator in accordance with anumber of embodiments of the present disclosure. Registers 230 can be AIregisters and include input information, output information, neuralnetwork information, and/or activation functions information, amongother types of information, for use by an AI accelerator, a controller,and/or memory arrays of a memory device (e.g., AI accelerator 124,memory controller 122, and/or memory arrays 125-1, . . . , 125-N in FIG.1 ). Registers can be read and/or written to based on commands from ahost, an AI accelerator, and/or a controller (e.g., host 102, AIaccelerator 124, memory controller 122 in FIG. 1 ).

Register 232-0 can define parameters associated with AI mode of thememory device. Bits in register 232-0 can start AI operations, restartAI operations, indicate content in registers is valid, clear contentfrom registers, and/or exit from AI mode.

Registers 232-1, 232-2, 232-3, 232-4, and 232-5 can define the size ofinputs used in AI operations, the number of inputs used in AIoperations, and the start address and end address of the inputs used inAI operations. Registers 232-7, 232-8, 232-9, 232-10, and 232-11 candefine the size of outputs of AI operations, the number of outputs in AIoperations, and the start address and end address of the outputs of AIoperations.

Register 232-12 can be used to enable the usage of the input blocks, theneuron blocks, the output blocks, the bias blocks, the activationfunctions, and the temporary blocks used during AI operations.

Registers 232-13, 232-14, 232-15, 232-16, 232-17, 232-18, 232-19,232-20, 232-21, 232-22, 232-23, 232-24, and 232-25 can be used to definethe neural network used during AI operations. Registers 232-13, 232-14,232-15, 232-16, 232-17, 232-18, 232-19, 232-20, 232-21, 232-22, 232-23,232-24, and 232-25 can define the size, number, and location of neuronsand/or layers of the neural network used during AI operations.

Register 232-26 can enable a debug/hold mode of the AI accelerator andoutput to be observed at a layer of AI operations. For example, acontroller can be configured to perform an AI operation on data storedin a number of memory arrays, stop the AI operation, and perform a debugoperation on the AI operation.

Register 232-26 can indicate that an activation should be applied duringAI operations and that the AI operation can step forward (e.g., performa next step in an AI operation) in AI operations. The controller canenable the AI accelerator to perform the debug operation on the AIoperation by programming a bit and/or bits of register 232-26 to aparticular state. In some examples, the first bit of register 232-26 canbe programmed to a first state to start the debug operation andprogrammed to a second state to stop and/or prevent the debug operation.The controller can program the bits and/or bits of register 232-26 to aparticular state in response to receiving a command from the host, forexample.

Register 232-26 can indicate that that the AI operation can step forward(e.g., perform a next step in an AI operation) in AI operations. In someexamples, a second bit of register 232-26 can be programmed to a firststate to indicate that the AI operation can step forward in AIoperations and to a second state to indicate that the AI operationcannot step forward.

Register 232-26 can indicate that the temporary blocks, where the outputof the layer is located, are valid. The temporary blocks can be read bythe host in response to the temporary blocks being indicated as valid byregister 232-26. A third bit of register 232-26 can be programmed to afirst state to indicate the temporary blocks are valid and to a secondstate to indicate the temporary blocks are invalid.

Debug operations can include storing data (e.g., errors and/or resultsfrom the AI operations) in the temporary blocks of the number of memoryarrays and validating the data. For example, a fourth bit of register232-26 can be programmed to a first state to store the errors from theAI operations for correction. In some examples, when the fourth bit ofregister 232-26 is programmed to a second state, there are no errorsstored. The data in the temporary blocks can be changed by a host and/ora controller on the memory device (e.g., to correct errors in data),such that the changed data can be used in the AI operation as the AIoperation steps forward.

The result of the debug operation can be stored and/or transmitted. Forexample, the result of the debug operation can be stored in a differentblock in the number of memory arrays and/or sent to a host. A fifth bitof register 232-26 can be programmed to a first state to send the resultof the debug operation to the host and a sixth bit of register 232-26can be programmed to a first state to store the result of the debugoperation in a different block in the number of memory arrays.

Registers 232-27, 232-28, and 232-29 can define the layer where thedebug/hold mode will stop the AI operation, change content of a neuralnetwork, change an input value, change a bias value, change anactivation function, observe the output of the layer, and/or send theoutput of the layer. In some examples, the registers 232-27, 232-28, and232-29 can define layers where errors consistently occur and/or layerswhere the neural network has been changed. Registers 232-30, 232-31,232-32, and 232-33 can define the size of temporary blocks used in AIoperations and the start address and end address of the temporary blocksused in AI operations. Register 232-30 can define the start address andend address of a first temporary block used in AI operations andregister 232-33 can define the start address and end address of a firsttemporary block used in AI operations. Registers 232-31, and 232-32 candefine the size of the temporary blocks used in AI operations.

Registers 232-34, 232-35, 232-36, 232-37, 232-38, and 232-39 can beassociated with the activation functions used in AI operations. Register232-34 can enable usage of the activation function block, enable usageof the activation function for each neuron, the activation function foreach layer, and enables usage of an external activation function.Registers 232-35 can define the start address and the end address of thelocation of the activation functions. Registers 232-36, 232-37, 232-38,and 232-39 can define the resolution of the inputs (e.g., x-axis) andoutputs (e.g., y-axis) of the activation functions.

Registers 232-40, 232-41, 232-42, 232-43, and 232-44 can define the sizeof bias values used in AI operations, the number of bias values used inAI operations, and the start address and end address of the bias valuesused in AI operations.

Register 232-45 can provide status information for the AI calculationsand provide information for the debug/hold mode. Register 232-45 canenable debug/hold mode, indicate that the AI accelerator is performingAI operations, indicate that the full capability of the AI acceleratorshould be used, indicate only matrix calculations of the AI operationsshould be made, and/or indicate that the AI operation can proceed to thenext neuron and/or layer.

Register 232-46 can provide error information regarding AI operations.Register 232-46 can indicate that there was an error in a sequence of anAI operation, that there was an error in an algorithm of an AIoperations, that there was an error in a page of data that ECC was notable to correct, and/or that there was an error in a page of data thatECC was able to correct.

Register 232-47 can indicate an activation function to use in AIoperations. Register 232-47 can indicated one of a number of pre-defineactivation function can be used in AI operations and/or a customactivation function located in a block can be used in AI operations.

Registers 232-48, 232-49, and 232-50 can indicate the neuron and/orlayer where the AI operation is executing. In the case where errorsoccur during the AI operations, registers 232-48, 232-49, and 232-50 canstore the location of the neuron and/or layer where an error occurred.

FIGS. 3A and 3B are block diagrams of a number of bits in a number ofregisters on a memory device with an artificial intelligence (AI)accelerator in accordance with a number of embodiments of the presentdisclosure. Each register 332-0, . . . , 332-50 can include a number ofbits, bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7,to indicate information associated with performing AI operations. Thenumber of registers can include 8 bits to store the informationassociated with performing the AI operations; however, the number ofregisters can include any number of bits based on a size of the memoryincluding the AI accelerator.

Register 332-0 can define parameters associated with AI mode of thememory device. Bit 334-5 of register 332-0 can be a read/write bit andcan indicate that an elaboration of an AI operation can restart 360 atthe beginning when programmed to 1b, for example, although otherprogramming conventions can be used. Bit 334-5 of register 332-0 can bereset to 0b once the AI operation has restarted. Bit 334-4 of register332-0 can be a read/write bit and can indicate that an elaboration of anAI operation can start 361 when programmed to 1b. Bit 334-4 of register332-0 can be reset to 0b once the AI operation has started.

Bit 334-3 of register 332-0 can be a read/write bit and can indicatethat the content of the AI registers is valid 362 when programmed to 1band invalid when programmed to 0b. Bit 334-2 of register 332-0 can be aread/write bit and can indicate that the content of the AI registers isto be cleared 363 when programmed to 1b. Bit 334-1 of register 332-0 canbe a read only bit and can indicate that the AI accelerator is in use363 and performing AI operations when programmed to 1b. Bit 334-0 ofregister 332-0 can be a write only bit and can indicate that the memorydevice is to exit 365 AI mode when programmed to 1b.

Registers 332-1, 332-2, 332-3, 332-4, and 332-5 can define the size ofinputs used in AI operations, the number of inputs used in AIoperations, and the start address and end address of the inputs used inAI operations. Bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and334-7 of registers 332-1 and 332-2 can define the size of the inputs 366used in AI operations. The size of the inputs can indicate the width ofthe inputs in terms of number of bits and/or the type of input, such asfloating point, integer, and/or double, among other types. Bits 334-0,334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-3and 332-4 can indicate the number of inputs 367 used in AI operations.Bits 334-4, 334-5, 334-6, and 334-7 of register 332-5 can indicate astart address 368 of the blocks in memory arrays of the inputs used inAI operations. Bits 334-0, 334-1, 334-2, and 334-3 of register 332-5 canindicate an end address 369 of the blocks in memory arrays of the inputsused in AI operations. If the start address 368 and the end address 369is the same address, only one block of input is indicated for the AIoperations.

Registers 332-7, 332-8, 332-9, 332-10, and 332-11 can define the size ofoutputs of AI operations, the number of outputs in AI operations, andthe start address and end address of the outputs of AI operations. Bits334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers332-7 and 332-8 can define the size 370 of the outputs used in AIoperations. The size of the outputs can indicate the width of theoutputs in terms of number of bits and/or the type of output, such asfloating point, integer, and/or double, among other types. Bits 334-0,334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-9and 332-10 can indicate the number of outputs 371 used in AI operations.Bits 334-4, 334-5, 334-6, and 334-7 of register 332-11 can indicate astart address 372 of the blocks in memory arrays of the outputs used inAI operations. Bits 334-0, 334-1, 334-2, and 334-3 of register 332-11can indicate an end address 373 of the blocks in memory arrays of theoutputs used in AI operations. If the start address 372 and the endaddress 373 is the same address, only one block of output is indicatedfor the AI operations.

Register 332-12 can be used to enable the usage of the input blocks, theneuron blocks, the output blocks, the bias blocks, the activationfunctions, and the temporary blocks used during AI operations. Bit 334-0of register 332-12 can enable the input blocks 380, bit 334-1 ofregister 332-12 can enable the neural network blocks 379, bit 334-2 ofregister 332-12 can enable the output blocks 378, bit 334-3 of register332-12 can enable the bias blocks 377, bit 334-4 of register 332-12 canenable the activation function blocks 376, and bit 334-5 and 334-6 ofregister 332-12 can enable a first temporary 375 block and a secondtemporary block 374.

Registers 332-13, 332-14, 332-15, 332-16, 332-17, 332-18, 332-19,332-20, 332-21, 332-22, 332-23, 332-24, and 332-25 can be used to definethe neural network used during AI operations. Bits 334-0, 334-1, 334-2,334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-13 and 332-14 candefine the number of rows 381 in a matrix used in AI operations. Bits334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers332-15 and 332-16 can define the number of columns 382 in a matrix usedin AI operations.

Bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 ofregisters 332-17 and 332-18 can define the size of the neurons 383 usedin AI operations. The size of the neurons can indicate the width of theneurons in terms of number of bits and/or the type of input, such asfloating point, integer, and/or double, among other types. Bits 334-0,334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-19,332-20, and 322-21 can indicate the number of neurons 384 of the neuralnetwork used in AI operations. Bits 334-4, 334-5, 334-6, and 334-7 ofregister 332-22 can indicate a start address 385 of the blocks in memoryarrays of the neurons used in AI operations. Bits 334-0, 334-1, 334-2,and 334-3 of register 332-5 can indicate an end address 386 of theblocks in memory arrays of the neurons used in AI operations. If thestart address 385 and the end address 386 is the same address, only oneblock of neurons is indicated for the AI operations. Bits 334-0, 334-1,334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-23,332-24, and 322-25 can indicate the number of layers 387 of the neuralnetwork used in AI operations.

Register 332-26 can enable a debug/hold mode of the AI accelerator andan output to be observed at a layer of AI operations. For example, acontroller can be configured to perform AI operations on data stored ina number of memory arrays, stop the AI operations, and perform debugoperations on the AI operations.

The controller can indicate that the AI accelerator is in a debug/holdmode by programming a bit and/or bits of register 332-26 to particularstates. Bit 334-0 of register 332-26 can indicate that the AIaccelerator is in a debug/hold mode and that an activation functionshould be applied 391 during AI operations. In some examples, bit 334-0can be programmed to a first state to start the debug operations andprogrammed to a second state to stop and/or prevent debug operationsfrom occurring. The controller can program bit 334-0 to the first stateand/or second state in response to receiving a command from the host,for example.

Bit 334-1 of register 332-26 can indicate that the AI operation can stepforward 390 (e.g., perform a next step in an AI operation) in AIoperations. In some examples, bit 334-1 can be programmed to a firststate to indicate that the AI operation can step forward 390 in AIoperations and to a second state to indicate that the AI operationcannot step forward. The programming of bit 334-1 can be embedded in theexecution of the AI operations. The AI operations can be stopped,results of the AI operations can be observed, errors can be corrected,and/or the register 332-26 can be reprogrammed to include another stepand/or remove a step in the AI operations. In some examples, previouscontent at a particular step of the AI operations can restore temporarycontent to see an effect of a modification on the AI operations.

Bit 334-2 and bit 334-3 of register 232-26 can indicate that thetemporary blocks, where the output of the layer is located, is valid 388and 389. For example, bit 334-2 and bit 334-3 of register 232-26 can beprogrammed to a first state to indicate the temporary blocks are valid388 and 389 and programmed to a second state to indicate the temporaryblocks are invalid. In some examples, indicating a temporary block isinvalid signals to the host and/or controller that data should not beread from the temporary block. The data in the temporary blocks can bechanged by a host and/or a controller on the memory device, such thatthe changed data can be used in the AI operation as the AI operationsteps forward.

The result of the debug operations can be stored and/or transmitted. Forexample, the result of the debug operations can be stored in a differentblock in the number of memory arrays and/or sent to a host. In someexamples, one or more of bits 334-4, . . . , 334-7 can be programmed toa first state to send the result of the debug operations to the host andone or more of bits 334-4, . . . , 334-7 can be programmed to a firststate to store the result of the debug operations in a different blockin the number of memory arrays.

Bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 ofregisters 332-27, 332-28, and 332-29 can define the layer where thedebug/hold mode will stop 392 the AI operation and observe the output ofthe layer.

Registers 332-30, 332-31, 332-32, and 332-33 can define the size oftemporary blocks used in AI operations and the start address and endaddress of the temporary blocks used in AI operations. Bits 334-4,334-5, 334-6, and 334-7 of register 332-30 can define the start address393 of a first temporary block used in AI operations. Bits 334-0, 334-1,334-2, and 334-3 of register 332-30 can define the end address 394 of afirst temporary block used in AI operations. Bits 334-0, 334-1, 334-2,334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-31 and 332-32 candefine the size 395 of the temporary blocks used in AI operations. Thesize of the temporary blocks can indicate the width of the temporaryblocks in terms of number of bits and/or the type of input, such asfloating point, integer, and/or double, among other types. Bits 334-4,334-5, 334-6, and 334-7 of register 332-33 can define the start address396 of a second temporary block used in AI operations. Bits 334-0,334-1, 334-2, and 334-3 of register 332-34 can define the end address397 of a second temporary block used in AI operations.

Registers 332-34, 332-35, 332-36, 332-37, 332-38, and 332-39 can beassociated with the activation functions used in AI operations. Bit334-0 of register 332-34 can enable usage of the activation functionblock 3101. Bit 334-1 of register 332-34 can enable holding that AI at aneuron 3100 and usage of the activation function for each neuron. Bit334-2 of register 332-34 can enable holding the AI at a layer 399 andthe usage of the activation function for each layer. Bit 334-3 ofregister 332-34 can enable usage of an external activation function 398.

Bits 334-4, 334-5, 334-6, and 334-7 of register 332-35 can define thestart address 3102 of activation function blocks used in AI operations.Bits 334-0, 334-1, 334-2, and 334-3 of register 332-35 can define theend address 3103 of activation functions blocks used in AI operations.Bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 ofregisters 332-36 and 332-37 can define the resolution of the inputs(e.g., x-axis) 3104 of the activation functions. Bits 334-0, 334-1,334-2, 334-3, 334-4, 334-5, 334-6, and 334-7 of registers 332-38 and332-39 can define the resolution of the outputs (e.g., y-axis) 3105 ofthe activation functions for a given x-axis value of a custom activationfunction.

Registers 332-40, 332-41, 332-42, 332-43, and 332-44 can define the sizeof bias values used in AI operations, the number of bias values used inAI operations, and the start address and end address of the bias valuesused in AI operations. Bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5,334-6, and 334-7 of registers 332-40 and 332-41 can define the size ofthe bias values 3106 used in AI operations. The size of the bias valuescan indicate the width of the bias values in terms of number of bitsand/or the type of bias values, such as floating point, integer, and/ordouble, among other types. Bits 334-0, 334-1, 334-2, 334-3, 334-4,334-5, 334-6, and 334-7 of registers 332-42 and 332-43 can indicate thenumber of bias values 3107 used in AI operations. Bits 334-4, 334-5,334-6, and 334-7 of register 332-44 can indicate a start address 3108 ofthe blocks in memory arrays of the bias values used in AI operations.Bits 334-0, 334-1, 334-2, and 334-3 of register 332-44 can indicate anend address 3109 of the blocks in memory arrays of the bias values usedin AI operations. If the start address 3108 and the end address 3109 isthe same address, only one block of bias values is indicated for the AIoperations.

Register 332-45 can provide status information for the AI calculationsand provide information for the debug/hold mode. Bit 334-0 of register332-45 can activate the debug/hold mode 3114. Bit 334-1 of register canindicate that the AI accelerator is busy 3113 and performing AIoperations. Bit 334-2 of register 332-45 can indicate that the AIaccelerator is on 3112 and/or that the full capability of the AIaccelerator should be used. Bit 334-3 of register 332-45 can indicateonly matrix calculations 3111 of the AI operations should be made. Bit.334-4 of register 332-45 can indicate that the AI operation can stepforward 3110 and proceed to the next neuron and/or layer.

Register 332-46 can provide error information regarding AI operations.The host can retrieve AI operation information when AI operations arebeing performed. Bit 334-3 of register 332-46 can indicate that therewas an error in a sequence 3115 of an AI operation. Bit 334-2 ofregister 332-46 can indicate that there was an error in an algorithm3116 of an AI operation. Bit 334-1 of register 332-46 can indicate therewas an error in a page of data that ECC was not able to correct 3117.Bit 334-0 of register 332-46 can indicate there was an error in a pageof data that ECC was able to correct 3118.

Register 332-47 can indicate an activation function to use in AIoperations. Bits 334-0, 334-1, 334-2, 334-3, 334-4, 334-5, and 334-6 ofregister 332-47 can indicate one of a number of pre-define activationfunctions 3120 can be used in AI operations. Bit 334-7 of register332-47 can indicate a custom activation function 3119 located in a blockcan be used in AI operations.

Registers 332-48, 33249, and 332-50 can indicate the neuron and/or layerwhere the AI operation is executing. Bits 334-0, 334-1, 334-2, 334-3,334-4, 334-5, 334-6, and 334-7 of registers 332-48, 332-49, and 332-50can indicate the address of the neuron and/or layer where the AIoperation is executing. In the case where errors occur during the AIoperations, registers 332-48, 332-49, and 332-50 can indicate the neuronand/or layer where an error occurred.

FIG. 4 is a block diagram of a number of blocks of a memory device withan artificial intelligence (AI) accelerator in accordance with a numberof embodiments of the present disclosure. Input block 440 is a block inthe memory arrays where input data is stored. Data in input block 440can be used as the input for AI operations. The address of input block440 can be indicated in register 5 (e.g. register 232-5 in FIGS. 2 and332-5 in FIG. 3A). Embodiments are not limited to one input block asthere can be a plurality of input blocks. Data input block 440 can besent to the memory device from the host. The data can accompany acommand indicated that AI operations should be performed on the memorydevice using the data.

Output block 420 is a block in the memory arrays where output data fromAI operations is stored. Data in output block 442 can be used store theoutput from AI operations and sent to the host. The address of outputblock 442 can be indicated in register 11 (e.g. register 232-11 in FIGS.2 and 332-11 in FIG. 3A). Embodiments are not limited to one outputblock as there can be a plurality of output blocks.

Data in output block 442 can be sent to host upon completion and/orholding of an AI operation. Temporary blocks 444-1 and 444-2 can beblocks in memory arrays where data is stored temporarily while AIoperations are being performed. Although FIG. 4 includes two temporaryblocks 444-1 and 444-2, the memory device can include one or moretemporary blocks. Data can be stored in temporary blocks 444-1 and 444-2while the AI operations are iterating through the neuron and layers ofthe neural network used for the AI operations. The address of temporaryblock 448 can be indicated in registers 30 and 33 (e.g. registers 232-30and 232-33 in FIGS. 2 and 332-30 and 332-33 in FIG. 3B). Embodiments arenot limited to two temporary blocks as there can be a plurality oftemporary blocks.

Activation function block 446 can be a block stored in the memory arraywhere the activation functions for the AI operations are stored and/orin the memory controller firmware. Activation function block 446 canstore pre-defined activation functions and/or custom activationfunctions that are created by the host and/or AI accelerator. Theaddress of activation function block 448 can be indicated in register 35(e.g. register 232-35 in FIGS. 2 and 332-35 in FIG. 3B). Embodiments arenot limited to one activation function block as there can be a pluralityof activation function blocks.

Bias values block 448 is a block in the memory array where the biasvalues for the AI operations are stored. The address of bias valuesblock 448 can be indicated in register 44 (e.g. register 232-44 in FIGS.2 and 332-44 in FIG. 3B). Embodiments are not limited to one bias valueblock as there can be a plurality of bias value blocks.

Neural network blocks 450-1, 450-2, 450-3, 450-4, 450-5, 450-6, 450-7,450-8, 450-9, and 450-10 are a block in the memory array where theneural network for the AI operations are stored. Neural network blocks450-1, 450-2, 450-3, 450-4, 450-5, 450-6, 450-7, 450-8, 450-9, and450-10 can store the information for the neurons and layers that areused in the AI operations. The address of neural network blocks 450-1,450-2, 450-3, 450-4, 450-5, 450-6, 450-7, 450-8, 450-9, and 450-10 canbe indicated in register 22 (e.g. register 232-22 in FIGS. 2 and 332-22in FIG. 3A).

FIG. 5 is a flow diagram illustrating an example artificial intelligenceprocess in a memory device with an artificial intelligence (AI)accelerator in accordance with a number of embodiments of the presentdisclosure. In response to starting an AI operation, an AI acceleratorcan write input data 540 and neural network data 550 to the input andneural network block, respectively. The AI accelerator can perform AIoperations using input data 540 and neural network data 550. The resultscan be stored in temporary blocks 544-1 and 544-2. The temporary blocks554-1 and 544-2 can be used to store data while performing matrixcalculations, adding bias data, and/or to apply activation functionsduring the AI operations.

An AI accelerator can receive the partial results of AI operationsstored in temporary blocks 544-1 and 544-2 and bias value data 548 andperform AI operations using the partial results of AI operations biasvalue data 548. The results can be stored in temporary blocks 544-1 and544-2.

An AI accelerator can receive the partial results of AI operationsstored in temporary blocks 544-1 and 544-2 and activation function data546 and perform AI operations using the partial results of AI operationsand activation function data 546. The results can be stored in outputblocks 542.

A controller can be configured to perform AI operations on data storedin a number of memory arrays, stop the AI operations, and perform adebug operation on the AI operations. Debug operations 552, 554, 556 canoccur after the AI accelerator performs AI operations using input data540 and neural network data 550, after performing AI operations usingthe partial results of AI operations bias value data 548, and/or afterperforming AI operations using the partial results of AI operations andactivation function data 546.

The controller can enable the apparatus to perform the debug operationson the AI operations by programming a bit and/or bits of a register to aparticular state. In some examples, the first bit of a register can beprogrammed to a first state to start the debug operations and programmedto a second state to stop and/or prevent the debug operations. Thecontroller can program the bits and/or bits of the register to aparticular state in response to receiving a command from the host, forexample.

A register can indicate that that the AI operation can step forward(e.g., perform a next step in an AI operation) in AI operations. In someexamples, a second bit can be programmed to a first state to indicatethat the AI operation can step forward in AI operations and to a secondstate to indicate that the AI operation cannot step forward.

The register can indicate that the temporary blocks, where the output ofthe layer is located, are valid. A third bit and/or a fourth bit of theregister can be programmed to a first state to indicate the temporaryblocks are valid and to a second state to indicate the temporary blocksare invalid.

Debug operations can include storing data from the AI operations in thetemporary blocks of the number of memory arrays and validating thetemporary blocks. The data (e.g., partial results from the AIoperations, errors from the AI operations, and/or a neural network,activation functions, input values, and/or bias values) in the temporaryblocks can be changed by a host and/or a controller on the memorydevice, such that the changed data can be used in the AI operation asthe AI operation steps forward.

The debug operation result can also be stored in temporary blocks 544-1and/or 544-2. The result of the debug operations, partial results fromthe AI operations, errors from the AI operations, and/or a neuralnetwork, activation functions, input values, and/or bias values can bestored and/or transmitted. For example, the result of the debugoperation can be stored in output block 542 in the number of memoryarrays and/or sent to a host. A fifth bit of the register can beprogrammed to a first state to send the result of the debug operationsto the host and a sixth bit can be programmed to a first state to storethe result of the debug operations in the output block.

FIG. 6A is a block diagram of an apparatus in the form of a computingsystem 600 including a memory device 620 with an artificial intelligence(AI) accelerator, which includes a memory array 625 in accordance with anumber of embodiments of the present disclosure. As used herein, amemory device 620, controller 640, memory array 625, sensing circuitry6138, and/or a number of additional latches 6140 might also beseparately considered an “apparatus.”

In FIG. 6A, the AI accelerator (e.g., AI accelerator 124 in FIG. 1 ) caninclude sensing circuitry 6138 and additional latches 6140, among othercomponents described in association with FIGS. 6A-8B, that areconfigured to perform operations, such as logic operations, associatedwith AI operations. As described below in associated with FIGS. 6A-9B,memory devices (e.g., memory device 620) can be configured to performoperations associated with AI operations as part of the AI accelerator.

As used herein, the additional latches are intended to mean additionalfunctionalities (e.g., amplifiers, select logic) that sense, couple,and/or move (e.g., read, store, cache) data values of memory cells in anarray and that are distinct from the plurality of compute components6148-1, . . . , 6148-M and/or logic stripes 6152-1, . . . , 6152-N in acompute unit in a data path of the plurality of shared I/O lines 6144shown in FIGS. 6B, 7, 8, 9A and 9B. The logic stripes 6152-1, . . . ,6152-N in a data path of a plurality of shared input/output (I/O) lines6144 local to the array, as shown in FIGS. 6A and 6B, may be associatedwith various bank sections 6150-1, . . . , 6150-N of memory cells in thebank 6146-1. The bank 6146-1 may be one of a plurality of banks on thememory device 620.

System 600 in FIG. 6A includes a host 602 coupled (e.g., connected) tothe memory device 620. Host 602 can be a host system such as a personallaptop computer, a desktop computer, a digital camera, a smart phone, ora memory card reader, among various other types of hosts. Host 602 caninclude a system motherboard and/or backplane and can include a numberof processing resources (e.g., one or more processors, microprocessors,or some other type of controlling circuitry). The system 600 can includeseparate integrated circuits or both the host 602 and the memory device620 can be on the same integrated circuit. The system 600 can be, forinstance, a server system and/or a high performance computing (HPC)system and/or a portion thereof. Although the examples shown in FIG. 6Aillustrates a system having a Von Neumann architecture, embodiments ofthe present disclosure can be implemented in non-Von Neumannarchitectures, which may not include one or more components (e.g., CPU,ALU, etc.) often associated with a Von Neumann architecture.

For clarity, the system 600 has been simplified to focus on featureswith particular relevance to the present disclosure. The memory array625 can be a DRAM array, SRAM array, STT RAM array, PCRAM array, TRAMarray, RRAM array, NAND flash array, and/or NOR flash array, among othertypes of arrays. The array 625 can include memory cells arranged in rowscoupled by access lines (which may be referred to herein as word linesor select lines) and columns coupled by sense lines (which may bereferred to herein as data lines or digit lines). Although a singlearray 625 is shown in FIG. 6A, embodiments are not so limited. Forinstance, memory device 620 may include a number of arrays 625 (e.g., anumber of banks of DRAM cells, NAND flash cells, etc.).

The memory device 620 can include address circuitry 6525 to latchaddress signals provided over a data bus 656 (e.g., an I/O bus connectedto the host 602) by I/O circuitry 6134 (e.g., provided to external ALUcircuitry and/or to DRAM DQs via local IO lines and global I/O lines).As used herein, DRAM DQs can enable input of data to and/or output ofdata from a bank (e.g., from and/or to the controller 640 and/or host602) via a bus (e.g., data bus 656). During a write operation, a voltage(high=1, low=0) can be applied to a DQ (e.g., a pin). This voltage canbe translated into an appropriate signal and stored in a selected memorycell. During a read operation, a data value read from a selected memorycell can appear at the DQ once access is complete and the output isenabled (e.g., by the output enable signal being low). At other times,DQs can be in a high impedance state, such that the DQs do not source orsink current and do not present a signal to the system. This also mayreduce DQ contention when two or more devices (e.g., banks) share acombined data bus, as described herein. Such DQs are separate anddistinct from the plurality of shared I/O lines 6144 (in FIG. 1AB) in adata path local to the array 625.

Status and exception information can be provided from the controller 640of the memory device 620 to a channel controller 604, for example,through an out-of-band (OOB) bus 657, e.g., high-speed interface (HSI),which in turn can be provided from the channel controller 604 to thehost 602. The channel controller 604 can include a logic component toallocate a plurality of locations (e.g., controllers for subarrays) inthe arrays of each respective bank to store bank commands, applicationinstructions (e.g., for sequences of operations), and arguments (PIMcommands) for various banks associated with operations for each of aplurality of memory devices 620. The channel controller 604 can dispatchcommands (e.g., PIM commands) to the plurality of memory devices 620 tostore those program instructions within a given bank 6146 (FIG. 6B) of amemory device 620.

Address signals are received through address circuitry 6525 and decodedby a row decoder 6132 and a column decoder 6142 to access the memoryarray 625. Data can be sensed (read) from memory array 625 by sensingvoltage and/or current changes on sense lines (digit lines) using anumber of sense amplifiers, as described herein, of the sensingcircuitry 6138. A sense amplifier can read and latch a page (e.g., arow) of data from the memory array 625. Additional compute circuitry, asdescribed herein, can be coupled to the sensing circuitry 6138 and canbe used in combination with the sense amplifiers to sense, store (e.g.,cache and/or buffer), perform compute functions (e.g., operations),and/or move data. The I/O circuitry 6134 can be used for bi-directionaldata communication with host 602 over the data bus 656 (e.g., a 64 bitwide data bus). The write circuitry 6136 can be used to write data tothe memory array 625.

Controller 640 (e.g., bank control logic, sequencer and timing circuitryshown in FIG. 6A) can decode signals (e.g., commands) provided bycontrol bus 654 from the host 602. These signals can include chip enablesignals, write enable signals, and/or address latch signals that can beused to control operations performed on the memory array 625, includingdata sense, data store, data movement (e.g., copying, transferring,and/or transporting data values), data write, and/or data eraseoperations, among other operations. In various embodiments, thecontroller 640 can be responsible for executing instructions from thehost 602 and accessing the memory array 625. The controller 640 can be astate machine, a sequencer, or some other type of controller. Thecontroller 640 can control shifting data (e.g., right or left) in a rowof an array (e.g., memory array 625) and execute microcode instructionsto perform operations such as compute operations, e.g., AND, OR, NOR,XOR, add, subtract, multiply, divide, etc.

Examples of the sensing circuitry 6138 are described further below(e.g., in FIGS. 6A-9B). For instance, in some embodiments, the sensingcircuitry 6138 can include a number of sense amplifiers and a number ofcompute components, which may serve as an accumulator and can be used toperform operations in each subarray (e.g., on data associated withcomplementary sense lines).

In some embodiments, the sensing circuitry 6138 can be used to performoperations using data stored in memory array 625 as inputs andparticipate in movement of the data for copy, transfer, transport,writing, logic, and/or storage operations to a different location in thememory array 625 without transferring the data via a sense line addressaccess (e.g., without firing a column decode signal). As such, variouscompute functions can be performed using, and within, sensing circuitry6138 rather than (or in association with) being performed by processingresources external to the sensing circuitry 6138 (e.g., by a processorassociated with host 602 and/or other processing circuitry, such as ALUcircuitry, located on device 620, such as on controller 640 orelsewhere). However, in addition, embodiments according to the presentdisclosure perform compute functions on data values moved to a pluralityof compute components 6148-1, . . . , 6148-M and/or logic stripes6152-1, . . . , 6152-N in a compute unit from the rows of the array. Andas an example, according to embodiments, compute operations may becontrolled in the compute unit at speeds of 2 nanoseconds (ns) withouthaving to move the data values back into the rows, as compared to anexample time required to fire the rows in the array of 60 nanoseconds(ns).

In various previous approaches, data associated with an operand, forinstance, would be read from memory via sensing circuitry and providedto external ALU circuitry via I/O lines (e.g., via local I/O linesand/or global I/O lines). The external ALU circuitry could include anumber of registers and would perform compute functions using theoperands, and the result would be transferred back to the array via theI/O circuitry 6134.

In contrast, embodiments according to the present disclosure performcompute functions on data values, moved to a plurality of computecomponents 6148-1, . . . , 6148-M and/or logic stripes 6152-1, . . . ,6152-N via a plurality of shared I/O lines 6144 from the rows of thearray, in a compute unit in a data path local to the array.Additionally, sensing circuitry 6138 may be configured to performoperations on data stored in memory array 625 and store the result backto the memory array 625 without enabling an I/O line (e.g., a local I/Oline) coupled to the sensing circuitry 6138. However, once loaded,compute operations may be controlled in the compute unit much faster,e.g., at speeds of 2 nanoseconds (ns), without having to move the datavalues back into the rows, as compared to an example time required tofire the rows in the array, e.g., 60 nanoseconds (ns). The sensingcircuitry 6138 can be formed on pitch with the memory cells of thearray. The plurality of compute components 6148-1, . . . , 6148-M and/orlogic stripes 6152-1, . . . , 6152-N, associated with the data path ofthe plurality of shared I/O lines 6144, have a pitch equal to that ofthe data path and that is a function of a pitch of digit lines to thearray of memory cells. For example, the compute component has a pitchthat is an integer multiple of the pitch of digit lines to the array ofmemory cells.

For example, the sensing circuitry 6138 described herein can be formedon a same pitch as a pair of complementary sense lines (e.g., digitlines). As an example, a pair of complementary memory cells may have acell size with a 6F² pitch (e.g., 3F×2F), where F is a feature size. Ifthe pitch of a pair of complementary sense lines for the complementarymemory cells is 3F, then the sensing circuitry being on pitch indicatesthe sensing circuitry (e.g., a sense amplifier and corresponding computecomponent per respective pair of complementary sense lines) is formed tofit within the 3F pitch of the complementary sense lines. Likewise, thecompute components 6148-1, . . . , 6148-M and/or logic stripes 6152-1, .. . , 6152-N, associated with the data path of the plurality of sharedI/O lines 6144, have a pitch that is a function of the 3F pitch of thecomplementary sense lines. For example, the compute components 6148-1, .. . , 6148-M and/or logic stripes 6152-1, . . . , 6152-N will have apitch that is an integer multiple of the 3F pitch of digit lines to thearray of memory cells.

By contrast, the circuitry of the processing resource(s) (e.g., acompute engine, such as an ALU) of various prior systems may not conformto pitch rules associated with a memory array. For example, the memorycells of a memory array may have a 4F² or 6F² cell size. As such, thedevices (e.g., logic gates) associated with ALU circuitry of previoussystems may not be capable of being formed on pitch with the memorycells (e.g., on a same pitch as the sense lines), which can affect chipsize and/or memory density, for example. In the context of somecomputing systems and subsystems (e.g., a central processing unit(CPU)), data may be processed in a location that is not on pitch and/oron chip with memory (e.g., memory cells in the array), as describedherein. For example, the data may be processed by a processing resourceassociated with a host, for instance, rather than on pitch with thememory.

As such, in a number of embodiments, circuitry external to array 625 andsensing circuitry 6138 is not needed to perform compute functions as thesensing circuitry 6138 can perform the appropriate operations to performsuch compute functions or can perform such operations in a data path ofa plurality of shared I/O lines local to the array without the use of anexternal processing resource. Therefore, the sensing circuitry 6138and/or the plurality of compute components 6148-1, . . . , 6148-M and/orlogic stripes 6152-1, . . . , 6152-N in a compute unit in a data path ofthe plurality of shared I/O lines 6144 may be used to complement or toreplace, at least to some extent, such an external processing resource(or at least the bandwidth consumption of such an external processingresource). In some embodiments, the sensing circuitry 6138 and/or theplurality of compute components 6148-1, . . . , 6148-M and/or logicstripes 6152-1, . . . , 6152-N in a compute unit in a data path of theplurality of shared IO lines 6144 may be used to perform operations(e.g., to execute instructions) in addition to operations performed byan external processing resource (e.g., host 602). For instance, host 602and/or sensing circuitry 6138 may be limited to performing only certainoperations and/or a certain number of operations.

Operations described herein can include operations associated with aprocessing in memory (PIM) capable device. PIM capable device operationscan use bit vector based operations. As used herein, the term “bitvector” is intended to mean a physically contiguous number of bits on abit vector memory device (e.g., a PIM device) stored physicallycontiguous in a row of an array of memory cells. Thus, as used herein a“bit vector operation” is intended to mean an operation that isperformed on a bit vector that is a contiguous portion of virtualaddress space (e.g., used by a PIM device). For example, a row ofvirtual address space in the PIM device may have a bit length of 16Kbits (e.g., corresponding to 16K complementary pairs of memory cells ina DRAM configuration). Sensing circuitry 6138, as described herein, forsuch a 16K bit row may include a corresponding 16K processing elements(e.g., compute components, as described herein) formed on pitch with thesense lines selectably coupled to corresponding memory cells in the 16bit row. A compute component in the PIM device may operate as a one bitprocessing element (PE) on a single bit of the bit vector of the row ofmemory cells sensed by the sensing circuitry 6138 (e.g., sensed byand/or stored in a sense amplifier paired with the compute component, asdescribed herein). Similarly, the plurality of compute components6148-1, . . . , 6148-M and/or logic stripes 6152-1, . . . , 6152-N in acompute unit in a data path of the plurality of shared I/O lines 6144may operate as a one bit processing element (PE) on a single bit of thebit vector of the row of memory cells sensed in an array.

Enabling an I/O line can include enabling (e.g., turning on, activating)a transistor having a gate coupled to a decode signal (e.g., a columndecode signal) and a source/drain coupled to the I/O line. However,embodiments are not limited to not enabling an I/O line. For instance,in a number of embodiments, the sensing circuitry (e.g., 6138) can beused to perform operations without enabling column decode lines of thearray.

However, the plurality of shared I/O lines 6144 may be enabled in orderto load data values to the plurality of compute components 6148-1, . . ., 6148-M and/or logic stripes 6152-1, . . . , 6152-N in a compute unitin a data path of the plurality of shared I/O lines 6144 where computeoperations may be controlled much faster. For example, in the pluralityof compute components 6148-1, . . . , 6148-M and/or logic stripes6152-1, . . . , 6152-N in the compute unit, the compute operation may beperformed at speeds of 2 nanoseconds (ns). This enhancement of speed canbe attributed to not having to move the data values back into the rowswith the associated time used in firing the rows in the array, e.g., 60nanoseconds (ns).

FIG. 6B is block diagram of an apparatus in the form of a computingsystem including a memory device having a shared input/out (PO) line ina data path local to bank sections of an array with an artificialintelligence (AI) accelerator in accordance with a number of embodimentsof the present disclosure. For example, bank 6146-1 can represent anexample bank of a memory device 620. As shown in FIG. 6B, a bank 6146-1can include a plurality of main memory columns (shown horizontally as X)(e.g., 16,384 columns in an example DRAM bank). Additionally, the bank6146-1 may be divided up into bank sections (e.g., quadrants of 32subarrays), 6150-1, 6150-2, . . . , 6150-N. Each bank section may beassociated with a plurality of compute components 6148-1, . . . , 6148-Min logic stripes 6152-1, . . . , 6152-N in a compute unit in a data pathof the plurality of shared I/O lines 6144. Each of the of the banksections 6150-1, . . . , 6150-N can include a plurality of rows (shownvertically as Y) (e.g., each section may be a quadrant that includes 32subarrays that each may include 512 rows in an example DRAM bank).Example embodiments are not limited to the example horizontal and/orvertical orientation of columns and rows described here or the examplenumbers thereof.

As shown in FIG. 6B, the bank 6146-1 can be divided into a plurality ofbank sections 6150-1, . . . , 6150-N. Each bank sections can have aplurality of compute components 6148-1, . . . , 6148-M and logic stripes6152-1, . . . , 6152-N in a compute unit in a data path of the pluralityof shared IO lines 6144 associated therewith. The bank 6146-1 caninclude a controller 640 to direct operations on data values loaded tothe plurality of compute components 6148-1, . . . , 6148-M in logicstripes 6152-1, . . . , 6152-N in a compute unit in a data path of theplurality of shared I/O lines 6144.

FIG. 7 is a schematic diagram illustrating sensing circuitry 7138 inaccordance with a number of embodiments of the present disclosure. Thesensing circuitry 7138 can correspond to sensing circuitry 6138 shown inFIG. 6A.

As shown in the example embodiment of FIG. 7 , a memory cell can includea storage element (e.g., capacitor) and an access device (e.g.,transistor). For example, a first memory cell can include transistor7160-1 and capacitor 7162-1, and a second memory cell can includetransistor 7160-2 and capacitor 7162-2, etc. In this embodiment, thememory array 725 is a DRAM array of 1T1B (one transistor one capacitor)memory cells, although other embodiments of configurations can be used(e.g., 2T2C with two transistors and two capacitors per memory cell). Ina number of embodiments, the memory cells may be destructive read memorycells (e.g., reading the data stored in the cell destroys the data suchthat the data originally stored in the cell is refreshed after beingread).

The cells of the memory array 725 can be arranged in rows coupled byaccess (word) lines 7164-X (Row X), 7164-Y (Row Y), etc., and columnscoupled by pairs of complementary sense lines (e.g., digit linesDIGIT(D) and DIGIT(D)_ shown in FIG. 7 ). The individual sense linescorresponding to each pair of complementary sense lines can also bereferred to as digit lines 7168-1 for DIGIT (D) and 7168-2 for DIGIT(D)_, respectively, or corresponding reference numbers in FIGS. 8 and9A-9B. Although only one pair of complementary digit lines are shown inFIG. 7 , embodiments of the present disclosure are not so limited, andan array of memory cells can include additional columns of memory cellsand digit lines (e.g., 4,096, 8,192, 16,384, etc.).

Although rows and columns are illustrated as orthogonally oriented in aplane, embodiments are not so limited. For example, the rows and columnsmay be oriented relative to each other in any feasible three-dimensionalconfiguration. For example, the rows and columns may be oriented at anyangle relative to each other, may be oriented in a substantiallyhorizontal plane or a substantially vertical plane, and/or may beoriented in a folded topology, among other possible three-dimensionalconfigurations.

Memory cells can be coupled to different digit lines and word lines. Forexample, a first source/drain region of a transistor 7160-1 can becoupled to digit line 7168-1 (D), a second source/drain region oftransistor 7160-1 can be coupled to capacitor 7162-1, and a gate of atransistor 7160-1 can be coupled to word line 7164-Y. A firstsource/drain region of a transistor 7160-2 can be coupled to digit line7168-2 (D)_, a second source/drain region of transistor 7160-2 can becoupled to capacitor 7162-2, and a gate of a transistor 7160-2 can becoupled to word line 7164-X. A cell plate, as shown in FIG. 7 , can becoupled to each of capacitors 7162-1 and 7162-2. The cell plate can be acommon node to which a reference voltage (e.g., ground) can be appliedin various memory array configurations.

The memory array 725 is configured to couple to sensing circuitry 7138in accordance with a number of embodiments of the present disclosure. Inthis embodiment, the sensing circuitry 7138 comprises a sense amplifier7170 and a compute component 7148 corresponding to respective columns ofmemory cells (e.g., coupled to respective pairs of complementary digitlines). The sense amplifier 7170 can be coupled to the pair ofcomplementary digit lines 7168-1 and 7168-2. The compute component 7148can be coupled to the sense amplifier 7170 via pass gates 7172-1 and7172-2. The gates of the pass gates 7172-1 and 7172-2 can be coupled tooperation selection logic 7178.

The operation selection logic 7178 can be configured to include passgate logic for controlling pass gates that couple the pair ofcomplementary digit lines un-transposed between the sense amplifier 7170and the compute component 7148 and swap gate logic for controlling swapgates that couple the pair of complementary digit lines transposedbetween the sense amplifier 7170 and the compute component 7148. Theoperation selection logic 7178 can also be coupled to the pair ofcomplementary digit lines 7168-1 and 7168-2. The operation selectionlogic 7178 can be configured to control continuity of pass gates 7172-1and 7172-2 based on a selected operation.

The sense amplifier 7170 can be operated to determine a data value(e.g., logic state) stored in a selected memory cell. The senseamplifier 7170 can comprise a cross coupled latch, which can be referredto herein as a primary latch. In the example illustrated in FIG. 7 , thecircuitry corresponding to sense amplifier 7170 comprises a latch 7175including four transistors coupled to a pair of complementary digitlines D 6168-1 and (D)_ 7168-2. However, embodiments are not limited tothis example. The latch 7175 can be a cross coupled latch (e.g., gatesof a pair of transistors) such as n-channel transistors (e.g., NMOStransistors) 7182-1 and 7182-2 are cross coupled with the gates ofanother pair of transistors, such as p-channel transistors (e.g., PMOStransistors) 7184-1 and 7184-2). The cross coupled latch 7175 comprisingtransistors 7182-1, 7182-2, 7184-1, and 7184-2 can be referred to as theprimary latch.

In operation, when a memory cell is being sensed (e.g., read), thevoltage on one of the digit lines 7168-1 (D) or 7168-2 (D)_ will beslightly greater than the voltage on the other one of digit lines 7168-1(D) or 7168-2 (D)_. An ACT signal and an RNL* signal can be driven lowto enable (e.g., fire) the sense amplifier 7170. The digit lines 7168-1(D) or 7168-2 (D)_ having the lower voltage will turn on one of the PMOStransistor 7184-1 or 7184-2 to a greater extent than the other of PMOStransistor 7184-1 or 7184-2, thereby driving high the digit line 7168-1(D) or 7168-2 (D)_ having the higher voltage to a greater extent thanthe other digit line 7168-1 (D) or 7168-2 (D)_ is driven high.

Similarly, the digit line 7168-1 (D) or 7168-2 (D)_ having the highervoltage will turn on one of the NMOS transistor 7182-1 or 7182-2 to agreater extent than the other of the NMOS transistor 7182-1 or 7182-2,thereby driving low the digit line 7168-1 (D) or 7168-2 (D)_ having thelower voltage to a greater extent than the other digit line 76168-1 (D)or 7168-2 (D)_ is driven low. As a result, after a short delay, thedigit line 7168-1 (D) or 7168-2 (D)_ having the slightly greater voltageis driven to the voltage of the supply voltage V_(CC) through a sourcetransistor, and the other digit line 7168-1 (D) or 7168-2 (D)_ is drivento the voltage of the reference voltage (e.g., ground) through a sinktransistor. Therefore, the cross coupled NMOS transistors 7182-1 and7182-2 and PMOS transistors 7184-1 and 7184-2 serve as a sense amplifierpair, which amplify the differential voltage on the digit lines 7168-1(D) and 7168-2 (D)_ and operate to latch a data value sensed from theselected memory cell on nodes 7177-1 and/or 7177-2.

Embodiments are not limited to the sense amplifier 7170 configurationillustrated in FIG. 7 . As an example, the sense amplifier 7170 can be acurrent-mode sense amplifier and a single-ended sense amplifier (e.g.,sense amplifier coupled to one digit line). Also, embodiments of thepresent disclosure are not limited to a folded digit line architecturesuch as that shown in FIG. 7 .

The sense amplifier 7170 can, in conjunction with the compute component7148, be operated to perform various operations using data from an arrayas input. In a number of embodiments, the result of an operation can bestored back to the array without transferring the data via a digit lineaddress access (e.g., without firing a column decode signal such thatdata is transferred to circuitry external from the array and sensingcircuitry via local I/O lines). As such, a number of embodiments of thepresent disclosure can enable performing operations and computefunctions associated therewith using less power than various previousapproaches. Additionally, since a number of embodiments eliminate theneed to transfer data across local and global I/O lines in order toperform compute functions (e.g., between memory and discrete processor),a number of embodiments can enable an increased (e.g., faster)processing capability as compared to previous approaches.

The sense amplifier 7170 can further include equilibration circuitry7174, which can be configured to equilibrate the digit lines 7168-1 (D)and 6768-2 (D)_. In this example, the equilibration circuitry 7174comprises a transistor 7188 coupled between digit lines 7168-1 (D) and7168-2 (D)_. The equilibration circuitry 7174 also comprises transistors7180-1 and 7180-2 each having a first source/drain region coupled to anequilibration voltage (e.g., V_(DD)/2), where V_(DD) is a supply voltageassociated with the array. A second source/drain region of transistor7180-1 can be coupled digit line 7168-1 (D), and a second source/drainregion of transistor 7180-2 can be coupled digit line 7168-2 (D)_. Gatesof transistors 7188, 7180-1, and 7180-2 can be coupled together, and toan equilibration (EQ) control signal line 7186. As such, activating EQenables the transistors 7188, 7180-1, and 7180-2, which effectivelyshorts digit lines 7168-1 (D) and 7168-2 (D)_ together and to theequilibration voltage (e.g., V_(CC)/2).

Although FIG. 7 shows sense amplifier 76170 comprising the equilibrationcircuitry 7174, embodiments are not so limited, and the equilibrationcircuitry 7174 may be implemented discretely from the sense amplifier7170, implemented in a different configuration than that shown in FIG. 7, or not implemented at all.

As described further below, in a number of embodiments, the sensingcircuitry 7138 (e.g., sense amplifier 7170 and compute component 7148)can be operated to perform a selected operation and initially store theresult in one of the sense amplifier 7170 or the compute component 7148without transferring data from the sensing circuitry via a local orglobal I/O line (e.g., without performing a sense line address accessvia activation of a column decode signal, for instance).

However, further to embodiments described herein, sensing circuitry 7138having sense amplifiers, and which in some embodiments may also includecompute components as shown in FIGS. 9A and 9B, can also couple thememory cells from a multiplexed column of memory cells in an array tothe compute components 9148-1, . . . , 9148-M and/or logic stripes9152-1, . . . , 9152-N in a compute unit 9198 in the data path of theplurality of shared I/O lines 9144 local to the array as discussed inconnection with FIGS. 9A and 9B. In this manner, the compute components9148-1, . . . , 9148-M and/or logic stripes 9152-1, . . . , 9152-N maybe indirectly coupled to the memory cells of a column through theplurality of shared I/O lines 9144 via select logic (discussed inconnection with FIGS. 9A and 9B).

Performance of operations (e.g., Boolean logical operations involvingdata values) is fundamental and commonly used. Boolean logicaloperations are used in many higher level operations. Consequently, speedand/or power efficiencies that can be realized with improved operations,can translate into speed and/or power efficiencies of higher orderfunctionalities.

As shown in FIG. 7 , the compute component 7148 can also comprise alatch, which can be referred to herein as a secondary latch 7190. Thesecondary latch 7190 can be configured and operated in a manner similarto that described above with respect to the primary latch 7175, with theexception that the pair of cross coupled p-channel transistors (e.g.,PMOS transistors) included in the secondary latch can have theirrespective sources coupled to a supply voltage 7176-2 (e.g., V_(DD)),and the pair of cross coupled n-channel transistors (e.g., NMOStransistors) of the secondary latch can have their respective sourcesselectively coupled to a reference voltage 7176-1 (e.g., ground), suchthat the secondary latch is continuously enabled. The configuration ofthe compute component 748 is not limited to that shown in FIG. 7 , andvarious other embodiments are feasible.

As described herein, a memory device (e.g., 620 in FIG. 6A) can beconfigured to couple to a host (e.g., 602) via a data bus (e.g., 656)and a control bus (e.g., 654). A bank 6146 in the memory device 620 caninclude a plurality of bank sections (6150-1, . . . , 6150-N in FIG. 6 )of memory cells. The bank 6146 can include sensing circuitry (e.g., 6138in FIG. 6A and corresponding reference numbers in FIGS. 7 and 8 )coupled to the plurality of arrays via a plurality of columns (FIG. 8 )of the memory cells. The sensing circuitry can include a sense amplifierand a compute component (e.g., 7170 and 7148, respectively, in FIG. 7 )coupled to each of the columns.

Each bank section 6150 can be associated with a plurality of logicstripes (e.g., 652-0, 5152-1, . . . , 56152-N−1 in FIG. 6B) in a computeunit in a data path of a plurality of shared I/O lines (6144 in FIG. 6B)local to array 725. A controller (e.g., 640 in FIGS. 6A-6B) coupled tothe bank can be configured to direct, as described herein, movement ofdata values to a compute component 9148 (FIG. 9A) in a logic stripe 9152(FIG. 9A) in a compute unit 8198/9198 (FIGS. 8 and 9A-9B) in a data pathof a shared IO line 8144/9144 (FIGS. 8 and 9A) local to the array.

The memory device can include a logic stripe (e.g., 6152 in FIG. 6B and9152 in FIG. 9A) having a plurality of compute components (e.g., 9148-1,. . . , 9148-Z, respectively in FIG. 9A) that can correspond to a numberof the plurality of columns (FIG. 6B) of the memory cells. As discussedfurther in connection with FIG. 7 , the number of sense amplifiers 7170and/or compute components 7148 in sensing circuitry 7138 can beselectably coupled (e.g., via column select circuitry 8194-1 and 8194-2in FIG. 8 ) to a plurality of shared IO lines 8144 (FIG. 8 ). The columnselect circuitry can be configured to selectably sense data in aparticular column of memory cells of an array by being selectablycoupled to a plurality of (e.g., four, eight, and sixteen, among otherpossibilities) sense amplifiers and/or compute components.

In some embodiments, a number of a plurality of logic stripes (e.g.,6152-1, . . . , 6152-N in FIG. 6B) in a bank can correspond to a numberof bank sections 650-1, . . . , 5650-N in FIG. 6B (e.g., a quadranthaving a plurality of subarrays) in the bank. A logic stripe can includea plurality of compute components 9148-1, . . . , 9148-Z (FIG. 9A) in adata path of a shared I/O local 9144 (FIG. 9A) to the array 725 that arelike compute components 7148 shown in FIG. 67 As will be shown in FIG. 8data values sensed from a row of the array can be moved in parallel bycolumn select logic via a plurality of shared I/O lines 8144 (FIG. 78 )to a plurality of compute components 9148 (FIG. 9A) in a compute unit8198 (FIG. 8 ) a data path of the plurality of shared I/O lines 8144(FIG. 8 ). In some embodiments, the amount of data can correspond to atleast a thousand bit width of the plurality of shared I/O lines.

As described herein, the array of memory cells can include animplementation of DRAM memory cells where the controller is configured,in response to a command, to move (e.g., copy, transfer, and/ortransport) data from the source location to the destination location viaa shared I/O line. In various embodiments, the source location can be ina first bank and the destination location can be in a compute unit 8198(FIG. 8 in a data path of the shared I/O lines 8144 (FIG. 8 ) local tothe array 725.

As described in FIG. 8 , the apparatus can be configured to move (e.g.,copy, transfer, and/or transport) data from a source location, includinga particular row (e.g., 819 in FIG. 7 ) and column address associatedwith a first number of sense amplifiers and compute components to ashared I/O line (e.g., 8144 in FIG. 8 ). In addition, the apparatus canbe configured to move the data to a destination location, including aparticular logic stripe 952 (FIG. 89 ) associated with a compute unit9198 (FIG. 89 ) in a data path of the shared I/O line 8194 (FIG. 9A). Asthe reader will appreciate, each shared I/O line 9144 (FIG. 8 ) canactually include a complementary pair of shared I/O lines (e.g., sharedI/O line and shared I/O line* in FIG. 8 ). In some embodiments describedherein, 2048 shared I/O lines (e.g., complementary pairs of shared I/Olines) can be configured as a 2048 bit wide shared I/O line. In someembodiments described herein, 1024 shared I/O lines (e.g., complementarypairs of shared I/O lines) can be configured as a 1024 bit wide sharedI/O line.

FIG. 8 is a schematic diagram illustrating circuitry for data movementin a memory device in accordance with a number of embodiments of thepresent disclosure. FIG. 8 shows eight sense amplifiers (e.g., senseamplifiers 0, 1, . . . , 7 shown at 8170-0, 8170-1, . . . , 8170-7,respectively) each coupled to a respective pair of complementary sharedI/O lines 8144 (e.g., shared I/O line and shared I/O line*). FIG. 8 alsoshows eight compute components (e.g., compute components 0, 1, . . . , 7shown at 8148-0, 8148-1, . . . , 8148-7) each coupled to a respectivesense amplifier (e.g., as shown for sense amplifier 0 at 8170-0) viarespective pass gates 8172-1 and 8172-2 and digit lines 8168-1 and8168-2. For example, the pass gates can be connected as shown in FIG. 2and can be controlled by an operation selection signal, Pass. Forexample, an output of the selection logic can be coupled to the gates ofthe pass gates 8172-1 and 8172-2 and digit lines 8168-1 and 8168-2.Corresponding pairs of the sense amplifiers and compute components cancontribute to formation of the sensing circuitry indicated at 8138-0,8138-1, . . . , 8138-7.

Data values present on the pair of complementary digit lines 8168-1 and8168-2 can be loaded into the compute component 8148-0 as described inconnection with FIG. 7 . For example, when the pass gates 8172-1 and8172-2 are enabled, data values on the pair of complementary digit lines8168-1 and 8168-2 can be passed from the sense amplifiers to the computecomponent (e.g., 8170-0 to 8148-0). The data values on the pair ofcomplementary digit lines 8168-1 and 8168-2 can be the data value storedin the sense amplifier 8170-0 when the sense amplifier is fired.

The sense amplifiers 8170-0, 8170-1, . . . , 8170-7 in FIG. 8 can eachcorrespond to sense amplifier 7170 shown in FIG. 7 . The computecomponents 8148-0, 8148-1, . . . , 8148-7 shown in FIG. 8 can eachcorrespond to compute component 6148 shown in FIG. 7 . A combination ofone sense amplifier with one compute component can contribute to thesensing circuitry (e.g., 8138-0, 8138-1, . . . , 8138-7) of a portion ofa DRAM memory subarray 8145 coupled to a shared I/O line 8144 shared bya number of logic stripes in a data path of the shared I/O lines 8144.

The configurations of embodiments illustrated in FIG. 8 are shown forpurposes of clarity and are not limited to these configurations. Forinstance, the configuration illustrated in FIG. 8 for the senseamplifiers 8170-0, 8170-1, . . . , 8170-7 in combination with thecompute components 8148-0, 8148-1, . . . , 8148-7 and the shared I/Oline 8144 is not limited to half the combination of the sense amplifiers8170-0, 8170-1, . . . , 8170-7 with the compute components 8148-0,8148-1, . . . , 8148-7 of the sensing circuitry being formed above thecolumns 8192 of memory cells (not shown) and half being formed below thecolumns 8192 of memory cells. Nor are the number of such combinations ofthe sense amplifiers with the compute components forming the sensingcircuitry configured to couple to a shared I/O line limited to eight. Inaddition, the configuration of the shared I/O line 8144 is not limitedto being split into two for separately coupling each of the two sets ofcomplementary digit lines 8168-1 and 8168-2, nor is the positioning ofthe shared IO line 8144 limited to being in the middle of thecombination of the sense amplifiers and the compute components formingthe sensing circuitry (e.g., rather than being at either end of thecombination of the sense amplifiers and the compute components).

The circuitry illustrated in FIG. 8 also shows column select circuitry8194-1 and 8194-2 that is configured to implement data movementoperations with respect to particular columns 8192 of a subarray 8145,the complementary digit lines 8168-1 and 8168-2 associated therewith,and the shared I/O line 8144 (e.g., as directed by the controller 640shown in FIGS. 6A-6B). For example, column select circuitry 8194-1 hasselect lines 0, 2, 4, and 6 that are configured to couple withcorresponding columns, such as column 0 (332-0), column 2, column 4, andcolumn 6. Column select circuitry 8194-2 has select lines 1, 3, 5, and 7that are configured to couple with corresponding columns, such as column1, column 3, column 5, and column 7. The column select circuitry 8194described in connection with FIG. 3 can, in various embodiments,represent at least a portion of the functionality embodied by andcontained in multiplexers, e.g., an eight (8) way multiplexer, sixteen(16) way multiplexer, etc.

Controller 840 can be coupled to column select circuitry 8194 to controlselect lines (e.g., select line 0) to access data values stored in thesense amplifiers, compute components, and/or present on the pair ofcomplementary digit lines (e.g., 8168-1 and 8168-2 when selectiontransistors 8196-1 and 8196-2 are activated via signals from select line0). Activating the selection transistors 8196-1 and 8196-2 (e.g., asdirected by the controller 540) enables coupling of sense amplifier8170-0, compute component 8148-0, and/or complementary digit lines8168-1 and 8168-2 of column 0 (8192-0) to move data values on digit line0 and digit line 0* to shared I/O line 8144. For example, the moved datavalues may be data values from a particular row 819 stored (cached) insense amplifier 8170-0 and/or compute component 8148-0. Data values fromeach of columns 0 through 7 can similarly be selected by the controlleractivating the appropriate selection transistors.

Moreover, enabling (e.g., activating) the selection transistors (e.g.,selection transistors 8196-1 and 8196-2) can enable a particular senseamplifier and/or compute component (e.g., 8170-0 and/or 8148-0,respectively) to be coupled with a shared I/O line 8144 such that datavalues stored by an amplifier and/or compute component can be moved to(e.g., placed on and/or transferred to) the shared I/O line 8144. Insome embodiments, one column at a time is selected (e.g., column 8192-0)to be coupled to a particular shared IO line 8144 to move (e.g., copy,transfer, and/or transport) the stored data values. In the exampleconfiguration of FIG. 8 , the shared IO line 8144 is illustrated as ashared, differential I/O line pair (e.g., shared IO line and shared IOline*). Hence, selection of column 0 (8192-0) could yield two datavalues (e.g., two bits with values of 0 and/or 1) from a row (e.g., row819) and/or as stored in the sense amplifier and/or compute componentassociated with complementary digit lines 8168-1 and 8168-2. These datavalues could be input in parallel to each shared, differential I/O pair(e.g., shared I/O and shared PO*) of the shared differential IO line8144.

FIG. 9A is a block diagram illustrating one of a plurality of sections9150 of an array 925 coupled to a compute unit 9198, having a pluralityof logic stripes 9152-1, . . . , 9152-N, by a plurality of shared IOlines 9144 in a data path local to the array 925. In the exampleembodiment of FIG. 9A a bank section 9150 (e.g., bank quadrant) is shownhaving a plurality of subarrays 9145-1, . . . , 9145-32. In FIG. 9A,thirty-two (32) subarrays are illustrated in a bank quadrant 9150.However, embodiments are not limited to this example. This example showsa bank section having 16K columns which are multiplexed by sixteen (16)to the shared I/O lines 9144. Thus, 16K columns are multiplexed to 1Kshared I/O lines 9144 such that every 16 columns can provide a datavalue that can be moved to the compute unit 9198 as a group of 1024 (1K)bits in parallel. Here, the shared I/O lines 9144 provide a 1K bit widedata path to the compute unit 9198.

In the example of FIG. 9A, each logic stripe 9152-1, . . . , 9152-N hasa plurality of compute components 9148-1, . . . , 9148-Z as the samehave been described herein in connection with the sensing circuitry 7138of FIG. 7 . In some embodiments, each of the plurality of logic stripes9152-1, . . . , 9152-N is configured to perform a compute function usingthe plurality of compute components 9148-1, . . . , 9148-Z. In someembodiments, each of the plurality of logic stripes 9152-1, . . . ,9152-Z can perform a different logical operation using the plurality ofcompute components 9148-1, . . . , 9148-Z. For example, in someembodiments at least one of the plurality of logic stripes 9152-1, . . ., 9152-Z can be configured to perform a long shift acceleratoroperation, e.g., eight (8) sixty-four (64) bit barrel shifter operation.This example could also provide a partial reorder in eight (8) bitchunks and could support a gather/scatter operation, in chunks of 256bits with an 8 bit cross bar. In another example, in some embodiments atleast one of the plurality of logic stripes 9152-1, . . . , 9152-Z canbe configured to perform Kogge-Stone acceleration to generate a partialcarry look ahead to accelerate a horizontal add. In another example, insome embodiments at least one of the plurality of logic stripes 9152-1,. . . , 9152-Z can be configured to perform “chunk” math acceleration.This example could provide vertical mode acceleration in small groups ofbits (e.g., 4 or 8 bit chunks). In another example, in some embodimentsthe plurality of logic stripes 9152-1, . . . , 9152-Z can be configuredto function as an explicit mask register to implement Boolean operationsas would be used by a compiler. As used herein, a “chunk” is intended toreference a smaller bit length than an addressed row of data, e.g., a256 bit chunk (within a 128 byte addressable row) may be addressed tomatch a bit width to a particular interface. This may be desirable tomatch a 256 bit interface of a 16K+ column memory array.

According to embodiments, the controller 540 (FIG. 5A) associated withthe bank section can execute microcode instructions to direct movementof the 1K bit data values in parallel from each multiplexed column inconnection with a particular accessed row among the plurality ofsubarrays 9145-1, . . . , 9145-32 to a particular compute component9148-1, . . . , 9148-Z of a particular logic stripe 9152-1, . . . ,9152-N in the compute unit 9198.

According to some embodiments, a butterfly network 9202 can be used toconnect the 1K bit data values to a respective one of the plurality ofcompute components 9148-1, . . . , 9148-Z in a respective one of theplurality of logic stripes 9152-1, . . . , 9152-N. By way of example,and not by way of limitation, 1K bits of data values can be moved inparallel to a logic strip associate with each of the 32 subarrays9145-1, . . . , 9145-32 in each of 4 quadrants to a bank section 9150.In this example, 128 logic stripes 9152-1, . . . , 9152-N having 1Kcompute components 9148-1, . . . , 9148-Z each can be included in thecompute unit 9198. Data values loaded to the plurality of computecomponents 9148-1, . . . , 9148-Z in the logic stripes 9152-1, . . . ,9152-N of the compute unit 9198 can be operated on according tomicrocode instructions from the controller 640 (FIG. 6A) to performoperations, e.g., AND, OR, NOR, XOR, add, subtract, multiply, divide,etc., on the data values as the same have been described herein inconnection with the sensing circuitry 7138 of FIG. 7 . As noted above,once the data values are loaded to the compute unit 9198, computeoperations may be controlled in the compute unit much faster, e.g., atspeeds of approximately 2 nanoseconds (ns), according to microcodeinstructions executed by the controller 640 (FIG. 6A) without having tomove the data values back into the rows of the array 525 (FIG. 5A). Forexample, compute operations may be performed using the compute unit 9198at a much faster speed as compared to an example time, e.g.,approximately 60 nanoseconds (ns), that may be required to fire andaccess rows in the array 625 (FIG. 6A).

In the example embodiment of FIG. 7A, the plurality of computecomponents 9148-1, . . . , 9148-Z and/or logic stripes 9152-1, . . . ,9152-N in the compute unit 9198, in the data path of the plurality ofshared I/O lines 9144, have a pitch equal to that of the data path of ashared I/O line. According to embodiments, the pitch of the data path isa function, e.g., multiple (2×, 4×, etc.), of a pitch of digit lines tothe array 525 (FIG. 5A) of memory cells. For example, the plurality ofcompute components 9148-1, . . . , 9148-Z and/or logic stripes 9152-1, .. . , 9152-N have a pitch that is an integer multiple of the pitch ofdigit lines to the array of memory cells.

FIG. 9B is a block diagram example illustrating a plurality of arrayscoupled to a plurality of compute components in a compute unit by aplurality of shared I/O lines in a data path local to the arrays wherethe compute component has a pitch equal to that of the data path of ashared I/O line and which is a multiple of a pitch of the digit lines tothe array. The example of FIG. 9B illustrates a plurality of arrays,e.g., bank quadrants 9150-1, 9150-2, sections of arrays, etc., which mayhave memory cells accessed by digit lines 9168.

In the example of FIG. 9B, the bank quadrants 9150-1 and 9150-2 areshown having a pitch that is approximately sixteen thousand (16K) digitlines 9168 wide according to a given feature dimension (design rule) ofa digit line fabrication process. Also shown are a plurality of sharedI/O lines 9144-1, 9144-2, . . . , 9144-Z which can have a differentpitch that is a function, e.g., multiple, of the given feature dimension(design rule) of the digit line fabrication process. In the example ofFIG. 9B, the data path of the plurality of shared I/O lines 9144-1,9144-Z have a pitch that is approximately sixteen (16) times greaterthan that of the digit lines 9168. Hence in this example, there areshown approximately one thousand (1K) shared I/O lines 9144-1, . . . ,9144-Z multiplexed to the 16K digit lines 9168 through 16:1multiplexors, e.g., 9204-1, . . . , 9204-Z and 9206-1, . . . 9206-Z,respectively. Embodiments, however, are not limited to the numericalexample provided here and more or fewer digit lines 9168 may bemultiplexed to a plurality of shared I/O lines 9144-1, . . . , 9144-Z.For example, the shared I/O lines 9144-1, . . . , 9144-Z can have apitch that is a multiple other than 16 times (e.g., 16×) that of thepitch of the digit lines 9168 as set by a given feature dimension(design rule) of the digit line fabrication process.

As shown in the example of FIG. 9B, a compute component, e.g., among aplurality of compute components 9148-1, . . . , 9148-Z and 9149-1, . . .9149-Z, may be associated with each shared I/O line 9144-1, . . . ,9144-Z, respectively. The plurality of compute components 9148-1, . . ., 9148-Z and 9149-1, . . . , 9149-Z may be within a plurality of logicstripes, e.g., 9152-1, 9152-2, . . . , 9152-N shown in FIG. 9A, of acompute unit shown as 9198-1 and 9198-2, respectively. As shown in theexample of FIG. 9B, a compute component, e.g., among a plurality ofcompute components 9148-1, . . . , 9148-Z and 9149-1, . . . , 9149-Zassociated with each shared I/O line 9144-1, . . . , 9144-Z, may have apitch that is equal to the data path of the shared I/O lines 9144-1, . .. , 9144-Z and hence sixteen times (e.g., 16×) that of the digit lines9168 to the arrays, e.g., 9150-1 and 9150-2. According to variousembodiments, since the compute components 9148-1, . . . , 9148-Z and9149-1, . . . , 9149-Z in the data path of the shared IO lines 9144-1, .. . , 9144-Z are not restricted in a one to one (e.g., 1× multiple)relationship with the pitch of the digit lines 8168, the computecomponents 9148-1, . . . , 9148-Z and 9149-1, . . . , 9149-Z are notlimited to the “vertical” alignment of the arrays 8150-1 and 9150-2 and,in this example, can be sixteen times (16×) larger. As such, the computecomponents 9148-1, . . . , 9148-Z and 9149-1, . . . , 9149-Z in the datapath of the shared I/O lines 9144-1, . . . , 9144-Z can be used toperform more robust set of logical operations on data values storedtherein (e.g., by having a larger footprint and space) such as the abovementioned long shift acceleration, while still being proximate to thearrays 9150-1 and 9150-1 and not off in a peripheral area of the arrayor memory die.

Although specific embodiments have been illustrated and describedherein, those of ordinary skill in the art will appreciate that anarrangement calculated to achieve the same results can be substitutedfor the specific embodiments shown. This disclosure is intended to coveradaptations or variations of various embodiments of the presentdisclosure. It is to be understood that the above description has beenmade in an illustrative fashion, and not a restrictive one. Combinationof the above embodiments, and other embodiments not specificallydescribed herein will be apparent to those of skill in the art uponreviewing the above description. The scope of the various embodiments ofthe present disclosure includes other applications in which the abovestructures and methods are used. Therefore, the scope of variousembodiments of the present disclosure should be determined withreference to the appended claims, along with the full range ofequivalents to which such claims are entitled.

In the foregoing Detailed Description, various features are groupedtogether in a single embodiment for the purpose of streamlining thedisclosure. This method of disclosure is not to be interpreted asreflecting an intention that the disclosed embodiments of the presentdisclosure have to use more features than are expressly recited in eachclaim. Rather, as the following claims reflect, inventive subject matterlies in less than all features of a single disclosed embodiment. Thus,the following claims are hereby incorporated into the DetailedDescription, with each claim standing on its own as a separateembodiment.

What is claimed is:
 1. An apparatus, comprising: a number of memoryarrays; a number of registers; and a controller configured to: stop anartificial intelligence (AI) operation at a particular layer of a neuralnetwork in response to a particular bit of a first register of thenumber of registers being programmed to a particular state; and performa debug operation on the AI operation in response to a particular bit ofa second register of the number of registers being programmed to aparticular state.
 2. The apparatus of claim 1, wherein the controller isconfigured to perform the AI operation on data stored in the number ofmemory arrays.
 3. The apparatus of claim 1, wherein the controller isconfigured to perform the debug operation to identify errors of the AIoperation.
 4. The apparatus of claim 1, wherein the controller isconfigured to store data in a temporary memory block of the number ofmemory arrays in response to a particular bit of a third register beingprogrammed to a particular state.
 5. The apparatus of claim 4, whereinthe data includes identified errors from the debug operation.
 6. Anapparatus, comprising: a number of memory arrays; a number of registers;and a controller configured to: perform a debug operation on anartificial intelligence (AI) operation to identify errors of the AIoperation in response to a particular bit of a first register of thenumber of registers being programmed to a particular state; store datain a temporary memory block of the number of memory arrays in responseto a particular bit of a second register of the number of registersbeing programmed to a particular state; and change the data stored inthe temporary memory block to correct the identified errors.
 7. Theapparatus of claim 6, wherein the controller is configured to stop theAI operation in response to a different bit of the first register of thenumber of registers being programmed to a particular state.
 8. Theapparatus of claim 7, wherein the controller is configured to continuethe AI operation in response to the different bit of the first registerbeing programmed to a different state.
 9. The apparatus of claim 8,wherein the controller is configured to continue the AI operation withthe changed data.
 10. The apparatus of claim 6, wherein the controlleris configured to validate the temporary memory block.
 11. The apparatusof claim 6, wherein the controller is configured to send a result of thedebug operation.
 12. A method, comprising: receiving a debug commandfrom a host; programming a particular bit of a first register of anumber of registers to a particular state in response to receiving thedebug command from the host; performing a debug operation on anartificial intelligence (AI) operation in response to the particular bitof the first register being programmed to the particular state;programming a particular bit of a second register of the number ofregisters to a particular state; and storing data in a temporary memoryblock in response to the particular bit of the second register beingprogrammed to the particular state.
 13. The method of claim 12,comprising performing the AI operation on data stored in a number ofmemory arrays.
 14. The method of claim 13, comprising performing the AIoperation using at least one of: input data, neural network data,activation function data, partial results of AI operations, or biasvalue data.
 15. The method of claim 12, comprising stopping the AIoperation at a particular layer of a neural network in response to aparticular bit of a third register of the number of registers beingprogrammed to a particular state.
 16. The method of claim 12, comprisingprogramming a different bit of the first register to a different state.17. The method of claim 16, comprising indicating the AI operation canstep forward to continue the AI operation in response to programming thedifferent bit of the first register to the different state.
 18. Themethod of claim 16, comprising indicating the temporary block is validin response to programming the different bit of the first register tothe different state.
 19. The method of claim 16, comprising storing aresult of the debug operation in response to programming the differentbit of the first register to the different state.
 20. The method ofclaim 16, comprising sending a result of the debug operation in responseto programming the different bit of the first register to the differentstate.